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Photoluminescence imaging for characterization of silicon material and solar cell devices

Category

Academic lecture

Language

English

Author(s)

Affiliation

  • SINTEF Digital / Microsystems and Nanotechnology
  • Unknown
  • University of Oslo

Presented at

Norwegian Electro-optics meeting 2014

Date

23.04.2014 - 23.04.2014

Year

2014

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