Leave-one-out classification error estimation in high dimensional feature spaces - the usual way, and the right way
Category
Poster
Language
English
Author(s)
- Fritz Albregtsen
- Helene Schulerud
Affiliation
- University of Oslo
- SINTEF Digital / Smart Sensors and Microsystems
Presented at
International Conference on Applied Genomics - 9th ESACP/16th ISDQP Meeting
Date
01.10.2003 - 04.10.2003