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Leave-one-out classification error estimation in high dimensional feature spaces - the usual way, and the right way

Category

Poster

Language

English

Author(s)

Affiliation

  • University of Oslo
  • SINTEF Digital / Smart Sensor Systems

Presented at

International Conference on Applied Genomics - 9th ESACP/16th ISDQP Meeting

Date

01.10.2003 - 04.10.2003

Year

2003

View this publication at Cristin