Electrical treeing from needle implants in XLPE during very low frequency (VLF) voltage testing
Category
Academic chapter
Language
English
Author(s)
- Erling Ildstad
- Kristian Fauskanger
- Jorunn Hølto
Affiliation
- SINTEF Energy Research / Elkraftteknologi
- Norwegian University of Science and Technology
Year
2013Publisher
IEEE (Institute of Electrical and Electronics Engineers)
Book
Solid Dielectrics (ICSD), 2013 IEEE International Conference on
ISBN
9781479908073
Page(s)
800 - 803
View this publication at Norwegian Research Information Repository