Conductivity control via minimally invasive anti-Frenkel defects in a functional oxide

Oppdragsgiver

• Norwegian University of Science and Technology / Onsager Fellowship Programme
• Research Council of Norway (RCN) / 245963
• Research Council of Norway (RCN) / NorFab
• Research Council of Norway (RCN) / 275139
• Sigma2 / ntnu243
• NORTEM / 197405
• EC/H2020 / 724529
• Research Council of Norway (RCN) / 231430
• Sigma2 / NN9264K
• Research Council of Norway (RCN) / 274459
• Norwegian University of Science and Technology / NTNU Stjerneprogrammet

Forfatter(e)

• Donald Evans
• Theodor Secanell Holstad
• Aleksander Buseth Mosberg
• Didrik René Småbråten
• Per Erik Vullum
• Anup Dadlani
• Konstantin Shapovalov
• Zewu Yan
• Edith Bourret
• David Zhe Gao
• Jaakko Akola
• Jan Torgersen
• Antonius Van Helvoort
• Sverre Magnus Selbach
• Dennis Meier

Institusjon(er)

• Norges teknisk-naturvitenskapelige universitet
• SINTEF Industri / Materialer og nanoteknologi
• Institut de Ciència de Materials de Barcelona
• Eidgenössische Technische Hochschule Zürich
• Lawrence Berkeley National Laboratory
• Storbritannia og Nord-Irland
• Tampereen yliopisto / Tammerfors universitet

DOI

Les fulltekst