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Hygrothermal aging of flip-chip assembled MOEMS

Sammendrag

A flip-chip version of an optical MEMS (MOEMS) assembly is demonstrated in this work. A dummy MOEMS device is attached directly onto a traditional FR-4 board using a novel isotropic conductive adhesive (ICA) in order to minimize both fabrication costs and footprint of the assembly. The assembly solution passed in situ electrical testing successfully during exposure to 85% relative humidity for 840 hours at 85 °C and 1000 hours at 95 °C. Two tested variants of the novel ICA were shown to perform better than a commercial reference material. Failures were observed for samples with the reference material after long exposure times or cool-down. Cross sections were made for inspection of failure mechanisms.

Kategori

Faglig foredrag

Språk

Engelsk

Forfatter(e)

Institusjon(er)

  • SINTEF Digital / Smart Sensors and Microsystems
  • Ukjent

Presentert på

13th International Conference and Exhibition on Device Packaging (DPC)

Sted

Fountain Hills, AZ

Dato

07.03.2017 - 09.03.2017

Arrangør

IMAPS

År

2017

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