Raman Seminar 31 Mai 2010 at the University of Oslo Organized by The Norwegian Raman Center, at the University of Oslo, Dept. of Chemistry Address: The Chemistry Building.,Sem Sælands vei 26, 0371 OSLO
Presentation of on the UiO Raman instrument, potential and flexibilities (possible upgrades included)
Microscopy / Confocal / depth profiles / imaging?
Applications - Surface studies in general - Oxide surfaces – can we see differences between different phases and modifications? - Silicon surfaces; solar silicon, thin layer (deposited) silicon, semiconductors etc) - Carbon: Graphite / graphine / nanotubes
Spectroscopic Ellipseometri: Interesting method for study of thin films. May be discussed with Gammadata during lunch.
Azpect. (Mikael Winter & Martin Glimtoft)
Presentation on the UiO laser excitation system, potential and flexibilities (possible upgrades included)
Applications - Conventional application - Frequency tuning to near electronic transitions in biological molecules - Resonance Raman; Surface enhanced Raman, Tip Enhanced Raman: Combination of AFM and Raman – sensitivity increased to ”single molecule” studies (more likely to be presented by K-analys?)
K-analys (Lars Hälldahl)
Raman combined with various other techniques
AFM / Raman combination to provide sensitivity at “single molecule” level
12:00-13:00
Lunch
13:00-17:00
Presentations: University of Oslo, Department of Molecular Biosciences (IMBV, Prof. Kristoffer Andersson’s group)
Raman studies of protein crystals (flavin, heme proteins). by Dr. Hans- Petter Hersleth
Raman of metallo- and radical protein (Cu and tyrosyl-radical proteins). by Dr. Niels H. Andersen
GE Healthcare (Ingvild Gausemel)
Use of Raman in the Pharmaceutical Industry.
Nofima Mat (Nils Kristian Alfseth)
Raman in food studies
- Raman Spectroscopic Characterization of Biological Systems on the Macro- and Micro Level.
Swiss-Norwegian Beam-line at the European Synchrotron Radiation Facility (ESRF) Grenoble (Wouter VAN BEEK)
Experimental opportunities for combining Raman Scattering with Synchrotron based Diffraction (XRD) and Absorption (XAFS) under non ambient conditions