Single chip power cycling tester
The findings from the 2000 A power cycling tester needed additional analyses to strenghten or falsify the failure hypothesis, related to the possible uneven pressure inside the disk
The development of a single chip power cycling tester was initiated in 2013 through a master thesis at NTNU with strong support from the OPE-project . The main conclusion was that the power cycling capability of individual chips is significantly better than for the entire disc. This result strengthened the hypothesis of unsymmetrical distribution of temperature and pressure, in addition to the observation of location dependent failures.
The following figures show the circuit schematic and pictures of the test setup