Characterization of thin and ultrathin transparent conducting oxide (TCO) films and TCO-Si interfaces with XPS, TEM and ab initio modeling

Author(s)

• Spyridon Diplas
• Ole Martin Løvvik
• Heidi Nordmark
• Despoina Maria Kepaptsoglou
• Joachim Seland Graff
• Cecile Ladam
• Frode Tyholdt
• John Walmsley
• Anette Eleonora Gunnæs
• Ragnar Fagerberg
• Alexander G. Ulyashin

Affiliation

• SINTEF Industry
• University of Oslo
• SINTEF Industry / Materials and Nanotechnology
• SINTEF Digital / Smart Sensors and Microsystems
• SINTEF Industry / Metal Production and Processing

Issue

6-7

DOI