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Source:IEEE NSS-MIC, Valencia, okt 23 - okt 29
Type:Presentation
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Source:6th Trento Workshop, Trento, mar 02 - mar 04
Type:Presentation
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Source:6TH World Congress on Process Tomography, Beijing, China, sep 06 - sep 09
Type:Presentation
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Source:N41-114, IEEE NSS – MIC, Knoxville, Tennessee, USA, okt 30 - nov 06
Type:Presentation
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Source:Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, 2009. MEMS/MOEMS '09DTIP of MEMS and MOEMS 2009, 1-3 April, Rome Italy. (s. 256-260). EDA Publishing.
Type:Conference paper/Book chapter
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Source:IEEE Sensors Journal 8, 9-10, 1539-1545.
Type:Journal article
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Source:Sensors and Actuators A-Physical 132, 1, 207-213.
Type:Journal article
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Source:5th IEEE Conference on Sensors, 2006. (s. 679-682). Washington: IEEE.
Type:Conference paper/Book chapter
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Source:IEEE Sensors Conference, Daegu, Korea, okt 25 - jan 01
Type:Presentation
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Source:Sensors and Actuators A-Physical 121, 1, 172-.
Type:Journal article
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