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Source:Germany: Wiley.
Type:Book
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Source:7th International Conference and Exhibition on Device Packaging. Scottsdale, Arizona: International Microelectronics and Packaging Society (IMAPS).
Type:Conference paper/Book chapter
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Source:7th International Conference and Exhibition on Device Packaging, Scottsdale, Arizona, feb 07 - mar 10
Type:Presentation
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Source:Smart System Integration 2011, Dresden, Germany, feb 22 - mar 23
Type:Presentation
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Source:7th International Conference and Exhibition on Device Packaging. Scottsdale, Arizona.
Type:Conference paper/Book chapter
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Source:7th International Conference and Exhibition on Device Packaging, Scottsdale, Arizona, mar 07 - mar 10
Type:Presentation
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Source:2010 IEEE International 3D Systems Integration Conference (3DIC), Munich, Germany, 16-18 Nov. 2010. (s. 274-277). IEEE Computer Society.
Type:Conference paper/Book chapter
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Source:SEMATECH 3D Interconnect Metrology Workshop, San Francisco, USA, jul 13 - jul 13
Type:Presentation
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Source:A seminar for the industry, presentations from two KMB projects, HiVe, nov 18 - nov 18
Type:Presentation
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Source:Microscopy and Analysis 25 (7), 9-12.
Type:Journal article
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Source:Proc. International Conference on Frontiers of Characterization and Metrology for Nanoelectronics. Grenoble, France.
Type:Conference paper/Book chapter
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Source:Microsystem Technologies : Micro- and Nanosystems Information Storage and Processing Systems 16, 7, 1051-1055.
Type:Journal article
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Source:SPIE Newsroom.
Type:Conference paper/Book chapter
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Ramm, Peter
,
Lietaer Nicolas
,
Raedt, Walter De
,
Fritzsch, Thomas
,
Hilt, Thierry
,
Couderc, Pascal
,
Val, Christian
,
Mathewson, Alan
,
Razeeb, Kafil M.
,
Stam, Frank
,
Klumpp, Armin
,
Weber, Josef
,
Taklo Maaike M Visser
Source:6th International Conference and Exhibition on Device Packaging, Scottsdale, Arizona, USA, mar 09 - mar 11
Type:Presentation
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Source:Advanced Materials and Technologies for Micro/Nano-Devices, Sensors and Actuators. (s. 191-203). Dordrecht: Springer.
Type:Conference paper/Book chapter
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Source:Smart System Integration and Reliability. Dresden: Goldenbogen verlag.
Type:Conference paper/Book chapter
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Source:40th European Solid-State Device Research Conference (ESSDERC), Sevilla, Spain, sep 13 - sep 17
Type:Presentation
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Source:Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX. (s. paper no 75920I). SPIE - International Society for Optical Engineering.
Type:Conference paper/Book chapter
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Source:54th Annual Fuze Conference. Kansas City, USA.
Type:Conference paper/Book chapter
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Source:Journal of Micro/Nanolithography 9, 4, 041108 (10 sider).
Type:Journal article
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