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Source:(SINTEF rapport)
Type:Report
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Source:IEEE NSS-MIC, Valencia, okt 23 - okt 29
Type:Presentation
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Source:6th Trento Workshop, Trento, mar 02 - mar 04
Type:Presentation
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Source:6TH World Congress on Process Tomography, Beijing, China, sep 06 - sep 09
Type:Presentation
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Source:N41-114, IEEE NSS – MIC, Knoxville, Tennessee, USA, okt 30 - nov 06
Type:Presentation
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Source:Norsk Elektrooptikkmøte 2008, Tromsø-Trondheim, mar 26 - mar 29
Type:Presentation
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