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Publications by Bahr Roy

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Source: (SINTEF Rapport; A27942)
Type: Report
Vermesan Ovidiu, Blystad Lars-Cyril, John Reiner, Hank Peter, Bahr Roy, Moscatelli Alessandro
Source: Design, Automation & Test in Europe, DATE 13, mar 18 - mar 22
Type: Presentation
Vermesan Ovidiu, Blystad Lars-Cyril, Reiner John, Hank Peter, Bahr Roy, Moscatelli Alessandro
Source: Conference on Design, Automation and Test in Europe, DATE 13, Grenoble, France — March 18 - 22, 2013. (s. 1740-1744). IEEE.
Type: Conference paper/Book chapter
Grindvoll Hanne, Vermesan Ovidiu, Crosbie Tracey, Bahr Roy, Dawood Nashwan, Revel Gian Marco
Source: Journal of Information Technology in Construction (ITcon) 17, 3, 43-62.
Type: Journal article
Ronchi, Daniele, Passi, Stefano, Bardelli, Roberto, Ricotti, Giulio, Sambi, Marco, Morelli, Marco, Vermesan Ovidiu, Bahr Roy, Eggen, Trym, Halvorsrød, Thomas
Source: 14th International European Power Electronics Conference and Exhibition (EPE 2011), Birmingham, UK, aug 30 - aug 30
Type: Presentation
Source: HITEN'2007 The International Conference on High Temperature Electronics, Oxford, England, sep 17 - sep 19
Type: Presentation
Source: Proceedings of the International Conference on High Temperature Electronics - HITEN'2005. (s. 46-50). England: Oxford Applied Technology Ltd.
Type: Conference paper/Book chapter
Vermesan Ovidiu, Blystad Lars-Cyril Julin, Bahr Roy, Hjelstuen Magnus, Beneteau Lionel, Froelich Benoit
Source: IEEE Journal of Solid-State Circuits 41, 7, 1638-1647.
Type: Journal article
Vermesan Ovidiu, Bahr Roy, Blystad Lars-Cyril Julin, Froelich B, Ullate LG, Martinez O, Yusta CF, Guey JL, Fleury G, Liang K, Mercier D, Schoeb P, McHugh J
Source: Ultrasonics Symposium, 2005 IEEE, 18-21 Sept. 2005. (s. 186-189 (vol. 1)). New York: IEEE.
Type: Conference paper/Book chapter
Source: Solid-State Circuits Conference, 2005. ESSCIRC 2005. Proceedings of the 31st European, 12-16 Sept. 2005. (s. 287-290). New York: IEEE.
Type: Conference paper/Book chapter
Vermesan Ovidiu, Bahr Roy, Blystad Lars-Cyril, Froelich B, Ullate LG, Martinez O, Yusta CF, Guey JL, Fleury G, Liang K, Mercier D, Schoeb P, McHugh J
Source: Ultrasonics Symposium, 2005 IEEE, 18-21 Sept. 2005. IEEE.
Type: Conference paper/Book chapter
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