Our services and customers:
SINTEF is working closely with industrial customers and other research institutions in the field of silicon solar cells. We want to build fundamental competence as well as address specific, process-related challenges. Since we started the activity in 2000, we have built up a reserve of characterization equipment specifically for solar grade silicon. In addition, we use a number of generic methods that are useful for studies of solar grade silicon.
Examples of characterization methods we use:
- Microstructure: Etching of defects in multi- and monocrystalline silicon: automatic quantification (PVScan) and manual analysis. Crystal orientation and grain boundaries by means of EBSD, Laue x-ray and TEM.
- Contaminants: Oxygen and carbon content by means of FTIR, IGFA / CIA. Mass spectrometry (GDMS, ICP-MS), Auger microscopy, EPMA / EDS, XRF / XPS
- Mechanical properties: Bending Testing (wafers), hardness (impression), tension (high-temperature)
- Electrical characteristics: Lifetime (CDI, μW-PCD, QSSPC / TPC), conductivity (4-point probe and eddy-current scanning), PL-scanning (band-to-band, high resolution), Lateral Photovoltage Scanning (LPS), EBIC, LBIC
Typical assignments for us are:
- Combined crystallization and characterization mission: We create a crystal in one of our crystallization furnaces according to customer orders, and characterizes the relevant material properties
- Analysis of externally produced samples
- Collaborations between industry and research institutions, supported by the Research Council or the EU