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Laboratory for advanced materials characterisation

Laboratory for advanced materials characterisation

Published 04 July 2016

The advanced materials characterisation laboratory in Oslo is equipped with a wide range of microscopes and surface analysis instruments able to image and analyse specimens on many length and depth scales. The local chemical composition and structure can also be determined from the micro- down to the atomic level.

TEM

A crucial step towards answering questions like "Did my experiment work?" or "Why the material I produced does not function?" or "What went wrong with my material processing?" is to find out what the material structure looks like and what it consists of.
We utilise a range of microscopy, spectroscopy and spectrometry techniques

Using our microscopy facilities, we can image objects from the millimetre down to the atomic scale in great detail using optical and electron microscopes. The bulk and surface chemical composition of the specimen can be measured using electrons, x-rays, or ion based spectroscopy and spectrometry techniques. The surface topography can be measured and visualised using optical interferometry or atomic force microscopy.

If the interesting part is deep inside the specimen, a polished cross section can be prepared, allowing direct inspection of the interior of virtually any material.

We work with a wide range of materials including polymers, metals, ceramics, composite, hybrid materials and electronics components in bulk, particulate or thin film form.

An overview of our equipment:

  • For imaging with light microscopy (LM)
    • Macroscope
    • Light Transmission Microscope
    • Light Reflection Microscope
  • For imaging and analysis with electron microscopy
    • Scanning Electron Microscope (SEM)
    • Transmission and Scanning Transmission Electron Microscopes (S-TEM)
  • For compositional and chemical surface analysis
    • X-ray Photoelectron Spectroscopy (XPS)
    • Secondary Ion Mass Spectrometry (SIMS)
  • For surface morphology and topography
    • White Light Interferometer (WLI)
    • Atomic Force Microscope (AFM)
  • For bulk chemical composition measurements
    • EDS (Energy Dispersive Spectroscopy) in SEM and (S)TEM
  • For sample preparation
    • Sample cutting, wheels, polishing instruments, cryo-milling

Our targeted application areas for advance materials characterisation

  • Metallurgical, Process, Chemical, Construction, Electronics Industry
  • Medical Technology
  • Energy technology
  • Environmental technologies
  • Catalysis
  • Nanotechnology
  • Oxidation, corrosion, bulk and surface material degradation
  • Surface modification, surface film thickness measurements, thin and ultra-thin film technologies

For more information, see our detailed descriprion of infrastructure

Research Manager

Contact

Visiting address:
Forskningsveien 1, Oslo

Contact person:
Spyridon Diplas, Cellphone: 982 30 427, Email: Spyros.Diplas@sintef.no