A crucial step towards answering questions like "Did my experiment work?" or "Why the material I produced does not function?" or "What went wrong with my material processing?" is to find out what the material structure looks like and what it consists of.
We utilise a range of microscopy, spectroscopy and spectrometry techniques
Using our microscopy facilities, we can image objects from the millimetre down to the atomic scale in great detail using optical and electron microscopes. The bulk and surface chemical composition of the specimen can be measured using electrons, x-rays, or ion based spectroscopy and spectrometry techniques. The surface topography can be measured and visualised using optical interferometry or atomic force microscopy.
If the interesting part is deep inside the specimen, a polished cross section can be prepared, allowing direct inspection of the interior of virtually any material.
We work with a wide range of materials including polymers, metals, ceramics, composite, hybrid materials and electronics components in bulk, particulate or thin film form.
An overview of our equipment:
- For imaging with light microscopy (LM)
- Light Transmission Microscope
- Light Reflection Microscope
- For imaging and analysis with electron microscopy
- Scanning Electron Microscope (SEM)
- Transmission and Scanning Transmission Electron Microscopes (S-TEM)
- For compositional and chemical surface analysis
- X-ray Photoelectron Spectroscopy (XPS)
- Secondary Ion Mass Spectrometry (SIMS)
- For surface morphology and topography
- White Light Interferometer (WLI)
- Atomic Force Microscope (AFM)
- For bulk chemical composition measurements
- EDS (Energy Dispersive Spectroscopy) in SEM and (S)TEM
- For sample preparation
- Sample cutting, wheels, polishing instruments, cryo-milling
Our targeted application areas for advance materials characterisation
- Metallurgical, Process, Chemical, Construction, Electronics Industry
- Medical Technology
- Energy technology
- Environmental technologies
- Oxidation, corrosion, bulk and surface material degradation
- Surface modification, surface film thickness measurements, thin and ultra-thin film technologies
For more information, see our detailed descriprion of infrastructure