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Hallvard Angelskår

Research Manager

Hallvard Angelskår

Research Manager

Hallvard Angelskår
Phone: 481 77 284
Mobile: 481 77 284
Department: Microsystems and Nanotechnology
Office: Oslo

publications and responsibilities

Publications

Publication

Design and simulation of efficient narrowband thermal emitter with 3 μm wavelength

http://www.sintef.no/en/publications/publication/?pubid=CRIStin+1456583

A low-power infrared source based on a silicon photonic-crystal membrane has been designed. Temperature distribution and reflection spectrum has been simulated. Large narrowband IR absorption is obtained with optimal material doping...

Year 2016
Type Conference paper/Book chapter
Publication

Design and Simulation of Efficient Narrowband Thermal Emitter with 3 µm wavelength

http://www.sintef.no/en/publications/publication/?pubid=CRIStin+1473120

A low-power infrared source based on a silicon photonic-crystal membrane has been designed. Temperature distribution and reflection spectrum has been simulated. Large narrowband IR absorption is obtained with optimal material doping....

Publication

Studying light-induced degradation by lifetime decay analysis: Excellent fit to solution of simple second-order rate equation

http://www.sintef.no/en/publications/publication/?pubid=CRIStin+1056694

Twenty different boron-doped Czochralski silicon materials have been analyzed for light-induced degradation. The carrier lifetime degradation was monitored by an automated quasi-steady-state photoconductance setup with an externally controlled bias lamp for in-situ illumination between measurements....

Authors Nærland Tine Uberg Haug Halvard Angelskår Hallvard Søndenå Rune Marstein Erik Stensrud Arnberg Lars
Year 2013
Type Journal article
Publication

Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection

http://www.sintef.no/en/publications/publication/?pubid=CRIStin+1026971

Oxygen induced stacking faults (OSFs) are mainly seen in oxygen rich wafers from the seed end of Cz-silicon crystals. In wafers this ring shaped OSF-region delineates a border between two defect regions; usually silicon self-interstitials dominate outside and vacancies inside this ring. High tempera...

Authors Søndenå Rune Hu Yu Juel Mari Wiig Marie Syre Angelskår Hallvard
Year 2013
Type Journal article
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