Measurements (XRD, SEM, profilometer, dielectric, ferroelectric and piezoelectric measurements) demonstrate that it is possible to deposit high quality piezoelectric PZT films onto 150 mm wafers with existing hardware and the developed process.
Published April 10, 2012
The research leading to these results has received funding from the European Community's Seventh Framework Programme (FP7/2010-2013) under grant agreement n° 229196